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revised February 09, 2022
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The SIFT process interleaves fast Fourier transforms back and forth between the time and frequency domains with applications of experimental data in the time domain and known zeroes or ''dark points'' in the frequency domain. In this manner, SIFT can fill in the time data points that are missing due to non-uniform sampling (NUS) or removed due to experimental problems.
In the sampling-limited cases, NUS enabled by SIFT can expedite high resolution multidimensional acquisition, by reducing the number of samples required at long evolution times.
In the sensitivity-limited cases, NUS enabled by SIFT can improve signal-to-noise by sampling more heavily early in each FID.
2-D, 3-D time domain datasets completed by SIFT may be output in nmrPipe format and Sparky format for further manipulation.